TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
OBERURSEL, GERMANY, March 22, 2023 /EINPresswire.com/ -- NEUMONDA Technology, the IP and innovation arm of the NEUMONDA Group, has successfully completed the first ...
During a component test, about 2-3% of the DRAMs fail. If only the modules are tested, the fail rate is about ten times higher. Our Octopus tester increases the yield and quality of DRAM modules.” — ...
Neumonda Technology, the memory IP and testing arm of Neumonda With its new Rhinoe DRAM tester, Neumonda revolutionizes memory testing at a fraction of the costs of traditional testers. We take a new ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results